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Figure 6
Orientation maps for substrate (Ni) and oxide film (CeO2) produced by X-ray microdiffraction. Color indicates the angle and direction of [001] with respect to surface normal (white).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 155-162
doi:10.1107/S0909049504026949
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