view article
Figure 9
The upper SEM image shows whiskers on a Sn film. The middle and lower false-color images show grain structure in adjacent images through the thickness of a Sn film. The blue and gray whiskers have distinct orientations that differ by ∼77°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 155-162
doi:10.1107/S0909049504026949
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS