Linear and circularly polarized light to study anisotropy and resonant scattering in magnetic thin films

Tolentino, H.C.N.; Cezar, J.C.; Souza-Neto, N.M.; Ramos, A.Y.

doi:10.1107/S0909049504032753

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
X-ray resonant scattering intensity around the Gd L₃ edge for the multilayer structure (Co_1 nm/Gd_0.2 nm)₄₀ over SiO₂. The edge is indicated by the vertical arrow. Kiessig fringes are also indicated by lateral arrows.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 12| Part 2| February 2005| Pages 168-176

doi:10.1107/S0909049504032753

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