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Figure 3
Sn L-line fluorescence profile (open circles) obtained from exciting a 100 nm tin oxide nanobelt with 7.0 keV X-rays while the nanobelt is horizontally scanned across the focused beam. The solid line is the fit to the measured data with the Vogt function, indicating an upper-limit beam spot of less than 200 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 124-128
doi:10.1107/S0909049504028596
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