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Figure 4
Two-dimensional mapping of the tin L-lines fluorescence intensity (a) and the diffraction intensity of the (030) reflection (b) from a 100 nm-width tin oxide nanobelt. The maximum intensity per pixel in (a) is 450 counts and that in (b) is 60000 counts.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 124-128
doi:10.1107/S0909049504028596
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