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Figure 5
X-ray diffraction spots of the (030) reflection from a 100 nm Sn2O3 nanobelt captured by a CCD detector. Starting from the left, each image was taken after a translation of the microbeam along the length of the nanobelt in steps of 200 nm. The first image is the diffraction spot obtained when the end of the belt was illuminated. The horizontal axis represents the 2θ direction and ranges from 36.5 to 39.5°. The vertical axis represents the χ direction and covers 8.5°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 124-128
doi:10.1107/S0909049504028596
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