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Figure 7
Measured (open diamonds) and calculated (solid line) X-ray θ–2θ scan profiles of the (030) reflection from the 100 nm triclinic tin oxide nanobelt shown in Fig. 6[link]. The calculation is based on the kinematic scattering theory, the lateral dimensions determined with SEM, and the single-lattice arrangement of atomic positions with a parameter of the number of atomic layers. The interference fringes and their frequency characterize the thickness of the nanobelt. The fitting of the profile led to a thickness of 29 nm.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 2| February 2005| Pages 124-128
doi:10.1107/S0909049504028596
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