Figure 3
Si (553) analyzer for the Cu K-edge. Dashed line: energy spread of the incident beam (FWHM = 167 meV); dashed-dotted line: source size contribution (FWHM = 121 meV); dotted line: intrinsic resolution of the bent crystal calculated by the TT method (FWHM = 59 meV); solid line: total calculated resolution from convolution of all contributions (FWHM = 232 meV); solid line with circles: experimental resolution, FWHM = 291 meV. All curves have been normalized to maximum for better visibility. |