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Figure 5
Si (551) analyzer for the Ni K-edge. Dashed line: energy spread of the incident beam (FWHM = 195 meV); dashed-dotted line: source size contribution (FWHM = 14 meV); dotted line: intrinsic resolution of the bent crystal calculated by the TT method (FWHM = 59 meV); solid line: total calculated resolution from convolution of all contributions (FWHM = 219 meV); solid line with circles: experimental resolution, FWHM = 291 meV. All curves have been normalized to maximum for better visibility.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 4| July 2005| Pages 473-478
https://doi.org/10.1107/S090904950501472X
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