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Figure 1
(i) Measured XAFS spectra of (a) Er-doped GaP (thin solid line), (b) Er- and O-doped GaAs (dotted line) and (c) Er-doped InP (bold solid line) at the Er LIII edge. (ii) Measured XAFS spectra of (d) GaP (thin solid line), (e) GaAs (dotted line) and (f) InP (bold solid line) at the Er LIII edge.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 4| July 2005| Pages 494-498
https://doi.org/10.1107/S0909049505011003
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