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Figure 2
Signal to background intensity ratio for samples of Er-doped GaP (triangles), Er- and O-doped GaAs (squares) and Er-doped InP (circles) as a function of the incident X-ray energy. The inset shows the signal (S) and background (B) intensity in the XAFS spectrum for Er- and O-doped GaAs.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 4| July 2005| Pages 494-498
https://doi.org/10.1107/S0909049505011003
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