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Figure 3
(i) X-ray intensity distributions for samples of (a) Er-doped GaP, (b) Er- and O-doped GaAs and (c) Er-doped InP. The Er Lα peak is almost buried in the background in Er-doped GaP and Er-doped GaAs, but is clearly observed in Er-doped InP. (ii) X-ray intensity distributions for the nominally undoped samples of (a) GaP, (b) GaAs, (c) InP and (d) InAs. The background X-rays below the elastically scattered X-rays is high and has a peak in GaP and GaAs, but low in InP and InAs and has a dip in InP.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 4| July 2005| Pages 494-498
https://doi.org/10.1107/S0909049505011003
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