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Figure 4
Change in the X-ray intensity distributions for GaAs with a change in the incident X-ray energy. Each spectrum is vertically shifted by a factor of 101.5 for clarity. The incident X-ray energy (E) was varied in the range from 6.575 to 9.917 keV. Dotted lines indicate the peak positions of Raman and elastic scattering. The Rh Lα peaks derive from the Rh-coated bent cylindrical mirror at the beamline.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 4| July 2005| Pages 494-498
https://doi.org/10.1107/S0909049505011003
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