Figure 6
Signal intensity for Er-doped GaP (circles), Er- and O-doped GaAs (squares) and Er-doped InP (triangles) as a function of sheet density of Er. The measurement time is for 200 s per incident X-ray energy point using ten elements of a SSD. The incident X-ray energy was fixed at 8.70 keV. The dotted lines show the statistical and experimental lowest limit of detection (LLD). |