On the refinement of time-resolved diffraction data: comparison of the random-distribution and cluster-formation models and analysis of the light-induced increase in the atomic displacement parameters

Vorontsov, I.I.; Coppens, P.

doi:10.1107/S0909049505014561

Journal of Synchrotron Radiation Journal of
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Figure 1
Correlation plots of the intensity effect from the cluster formation (CF) model versus the random distribution (RD) model (a) on intensities, (b) on the response ratios. Simulated data on {[3,5-(CF₃)₂pyrazolate]Cu}₃, 12% excited-state population.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 12| Part 4| July 2005| Pages 488-493

https://doi.org/10.1107/S0909049505014561

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