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Figure 1
Experimental set-up for time-resolved triple-crystal diffractometry. The X-ray beam monochromated by the double-Si(111) monochromator was incident on a GaAs (100) sample wafer. The 400 reflection from the sample was detected through the Si(111) analyzer by a PIN photodiode in photoconductive mode. The output of the photodiode was amplified and then averaged by a digital storage oscilloscope.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 685-689
doi:10.1107/S0909049505017280
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