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Figure 5
Diffraction profile from Te-II at 4.9 GPa, showing the complexity of the diffraction pattern. The inset shows the single very weak reflection at a d-spacing of ∼7.1 Å (2θ = 3.8°).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 549-553
doi:10.1107/S0909049505022788
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