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Figure 7
Rietveld refinement of triclinic Te-II at 4.9 GPa. The upper and lower tick marks show the calculated peak positions for Te-II and for a trace component of Te-III, respectively. The difference between the observed and calculated patterns is shown below the tick marks. Modified after Hejny & McMahon (2004BB6).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 549-553
doi:10.1107/S0909049505022788
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