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Figure 6
Schematic drawing of the sample-centering procedure. The aim is to place the DAC exactly onto the rotation axis. To do this we need to find the offset shift z. By measuring the DAC position at 0° and ω rotation relative to the X-ray beam (through scans of the sample hole across the beam), distance dx is determined. The offset z is then calculated as z = dx/tanω. Moving the DAC by this amount along the z-stage will place it on the rotation axis. The same procedure can also be used to place a calibrant onto the rotation axis, which is used to determine the distance between rotation axis and detector plane.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 650-658
doi:10.1107/S0909049505020959
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