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![[Figure 2]](xd5015fig2mag.jpg)
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Figure 2
Differential aperture microscopy applied to obtain resolution along the incident X-ray beam in a Laue microdiffraction experiment with a penetrating beam. The position of the movable wire can be precisely calibrated with respect to the detector and the incident X-ray beam. As the wire moves near the sample surface it intercepts X-rays diffracted from the grains in the sample. Changes of the diffracted intensity into each pixel of the detector can be correlated to the wire position and ray-traced back to the intercept with the incident beam. In this way the Laue diffraction pattern from each subgrain volume element along the incident beam path can be determined. |
![[Figure 2]](xd5015fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
