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Figure 8
Laue patterns with the incident beam illuminating the sample (a and b) and passing through the gasket hole away from the sample (c and d). Images (a) and (c) are taken at χ = 0°, images (b) and (d) at χ = 20°.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 5| August 2005| Pages 608-617
doi:10.1107/S0909049505024684
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