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Figure 7
The positional sensitivity of the device is measured by moving the device through the beam in steps of 10 µm and 100 µm (inset) in the vertical direction. The lower panel shows the best-fit residues.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 12| Part 6| October 2005| Pages 800-806
doi:10.1107/S0909049505031250
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