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Figure 4
(a) Normalized focusing profiles from an infinitely-short capillary of the various flatness sources. For all the sources with the same cross-section area [same δxδy for profile of exp(−x2/δx2) exp(−y2/δy2)], as the flatness increases (δy/δx decreases), the profile will deviate away from Gaussian with a narrow FWHM at the profile center but more X-rays at the wings. (b) The double Gaussian approximation agrees with the angular averaged profile for a source with δy/δx as small as 0.25, but starts to show a clear difference when the source is as flat as δy/δx = 0.1, as shown in (c).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 1| December 2006| Pages 74-84
doi:10.1107/S0909049505038562
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