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Figure 5
Experimental X-ray reflectivity of a polystyrene film on a Si wafer (dots) compared with the result of a fit on the basis of the Parratt algorithm (solid line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 1| December 2006| Pages 8-13
doi:10.1107/S0909049505035685
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