The new diffractometer for surface X-ray diffraction at beamline BL9 of DELTA

Krywka, C.; Paulus, M.; Sternemann, C.; Volmer, M.; Remhof, A.; Nowak, G.; Nefedov, A.; Pöter, B.; Spiegel, M.; Tolan, M.

doi:10.1107/S0909049505035685

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 6
Out-of-plane high-angle radial scan (Θ − 2Θ scan) of an epitaxically grown Gd₄₀Y₆₀ film on a Nb (110)/Al₂O₃ (11–20) substrate. Finite-size oscillations of the Nb (110) reflection are indicated by arrows.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 13| Part 1| December 2006| Pages 8-13

doi:10.1107/S0909049505035685

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