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Figure 4
(a) SEM image of the region of interest. The sample is 150 µm thick. (b) Map of the X-ray response observed in the region displayed in (a) using a micrometer-size focused X-ray beam at 6 keV. The sensitivity of the detector appears to be closely dependent on the material as the grain structure can be clearly recognized. (c) Same map but measured at 3 keV (see text).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 2| March 2006| Pages 151-158
https://doi.org/10.1107/S0909049505032097
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