Figure 9
Energy resolution as a function of count rate for an incident energy Ex = 277 eV. Operation up to ∼20000 counts s−1 pixel−1 is possible at the highest energy resolution, and operation up to ∼100000 counts s−1 is possible for shorter shaping times at reduced resolution. The inset shows the band diagram in Nb–Al–AlOx–Al–Nb STJ detectors and the charge flow upon X-ray absorption. |