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Figure 4
The concept of a DEPFET: simplified device structure (left) and potential distribution along a cut across the wafer in the gate region of the transistor (right).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 2| March 2006| Pages 99-109
https://doi.org/10.1107/S0909049506002214
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