Development of a scanning tunneling microscope for in situ experiments with a synchrotron radiation hard-X-ray microbeam

Saito, A.; Maruyama, J.; Manabe, K.; Kitamoto, K.; Takahashi, K.; Takami, K.; Yabashi, M.; Tanaka, Y.; Miwa, D.; Ishii, M.; Takagi, Y.; Akai-Kasaya, M.; Shin, S.; Ishikawa, T.; Kuwahara, Y.; Aono, M.

doi:10.1107/S0909049506001622

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 3
STM image of a clean Si(111) surface with `on–off' switching of X-ray irradiation. The scan area was 20 nm × 20 nm with a sample bias of +2 V and a tunneling current of 0.3 nA. The inset shows a silhouette in the beam of diameter 200 µm.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 13| Part 2| March 2006| Pages 216-220

https://doi.org/10.1107/S0909049506001622

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