On the use of CCD area detectors for high-resolution specular X-ray reflectivity

Fenter, P.; Catalano, J.G.; Park, C.; Zhang, Z.

doi:10.1107/S0909049506018000

Journal of Synchrotron Radiation Journal of
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Figure 6
Comparison of CCD and scintillator detector measurements of the orthoclase–water interface at specular reflection conditions characterized by L = 1.51, where the surface reflectivity is relatively weak. (a) One-dimensional projection of a CCD image along X. (b) Rocking scans of the same sample under identical scattering conditions (except for a smaller detector slit aperture as appropriate for minimizing background with a scintillator detector).

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 13| Part 4| July 2006| Pages 293-303

https://doi.org/10.1107/S0909049506018000

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