On the use of CCD area detectors for high-resolution specular X-ray reflectivity

Fenter, P.; Catalano, J.G.; Park, C.; Zhang, Z.

doi:10.1107/S0909049506018000

Journal of Synchrotron Radiation Journal of
Synchrotron Radiation

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Figure 8
Reproducibility tests for the CCD repeatedly measuring the same scattering condition at (a) L = 1.9 and (b) L = 1.51. Note the difference in vertical scales for the two sets of data. The black horizontal line indicates the average value for each set of measurements.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 13| Part 4| July 2006| Pages 293-303

https://doi.org/10.1107/S0909049506018000

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