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Figure 6
(a) Normalized EXAFS oscillations for 100 nm-thick LSCO grown on LSAO substrate with various incidence angles θ. Anomalies (sharp peaks and wiggles) are obvious for geometries with θ = 5° and θ = 10°. By choosing an optimum angle of incidence for 100 nm thickness, artifacts are suppressed. (b) Expanded plot of the same data.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 4| July 2006| Pages 314-320
https://doi.org/10.1107/S0909049506015251
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