view article
Figure 8
(a) Normalized Cu K-EXAFS oscillations for 100 nm-thick LSCO thin film grown on LSAO (solid line) and bulk single-crystal (dashed line). The upper and lower rows indicate the data recorded at 300 K and 10 K, respectively. (b) Magnitude of the complex Fourier transform for the EXAFS curves recorded at 300 K for thin film (solid line) and for a single crystal (dashed line).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 13| Part 4| July 2006| Pages 314-320
https://doi.org/10.1107/S0909049506015251
Follow J. Synchrotron Rad.
Sign up for e-alerts
E-alerts
Follow J. Synchrotron Rad. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS