Stable top-up operation at SPring-8

Tanaka, H.; Adachi, M.; Aoki, T.; Asaka, T.; Baron, A.; Daté, S.; Fukami, K.; Furukawa, Y.; Hanaki, H.; Hosoda, N.; Ishikawa, T.; Kimura, H.; Kobayashi, K.; Kobayashi, T.; Kohara, S.; Kumagai, N.; Masaki, M.; Masuda, T.; Matsui, S.; Mizuno, A.; Nakamura, T.; Nakatani, T.; Noda, T.; Ohata, T.; Ohkuma, H.; Ohshima, T.; Oishi, M.; Sasaki, S.; Schimizu, J.; Shoji, M.; Soutome, K.; Suzuki, M.; Suzuki, S.; Suzuki, Y.; Takano, S.; Takao, M.; Takashima, T.; Takebe, H.; Takeuchi, A.; Tamura, K.; Tanaka, R.; Tanaka, Y.; Taniuchi, T.; Taniuchi, Y.; Tsumaki, K.; Yamashita, A.; Yanagida, K.; Yoda, Y.; Yonehara, H.; Yorita, T.; Yoshioka, M.; Takata, M.

doi:10.1107/S0909049506022862

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Figure 20
X-ray diffraction patterns of amorphous silica measured at BL04B2 (a) for conventional operation and (b) for top-up operation. (c) Differences in scattering intensity between the first and second scans.

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ISSN: 1600-5775

Volume 13| Part 5| August 2006| Pages 378-391

doi:10.1107/S0909049506022862

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