view article

Figure 3
Typical Laue diffraction patterns of the sample. The scale bar is 30 mm. This image was detected by the flat-panel imager. The exposure time was 1 s. Several Laue diffraction patterns were recorded without overlapping. This sample was composed of many subgrains.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds