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Figure 5
Evolution of surface and interface roughnesses of superlattices in the initial stage of growth. The sublayer thickness was fixed at 1, 3 and 10 nm and the bilayer number varied from 1 to 5. The data were derived from the fitting results of curves of X-ray reflectivity in situ.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 1| December 2007| Pages 163-168
doi:10.1107/S0909049506045304
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