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Figure 1
Schematic of the sagittal-focusing multilayer substrate. The substrate is prepared from a Si (111) slab. The central thin portion maintains the golden aspect ratio of 1.42 (90:63.4). The multilayer is deposited on the flat side. The thick wings were clamped to the bender. The bender can dynamically change the sagittal radius of the crystal by introducing a bending load. The resulting cylindrical-shaped surface can focus the reflecting X-ray beam horizontally.

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ISSN: 1600-5775
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