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Figure 5
Bending characteristics of the sagittal multilayer element mounted on a Kohzu bender from optical metrology measurements. The optical metrology measurement can only measure radii up to ∼1 m; the data were extrapolated to the sub-metre range by an inverse polynomial fitting.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 1| December 2007| Pages 138-143
doi:10.1107/S0909049506050205
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