view article

Figure 6
X-ray beam shape in the end-station imaged by a CCD camera while the bender dynamically changes the bending radius of the sagittal crystal, in turn, the focal distance. The images correspond to under-focus (ae), focus (f) and over-focus (gi) bending conditions.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds