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Figure 9
X-ray metrology study of the sagittal substrate surface profile when it is bent to a sagittal radius of 1 m. The substrate was oriented to intercept the incoming X-ray beam at the Bragg angle. The upper nine panels show the X-ray beam shape in the end-station when an X-ray beam with 0.1 mm vertical size is scanned through the surface vertically. The lower six panels show the X-ray beam shape when an X-ray slit of 5 mm horizontal size is scanned through the surface horizontally.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 1| December 2007| Pages 138-143
doi:10.1107/S0909049506050205
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