view article

Figure 1
Schematic representation of the optics on ID24 of the ESRF. A white beam from an undulator source illuminates a bent Si(111) polychromator crystal, creating a wavelength-dispersive fan of X-rays covering an equivalent energy range of several hundred eV. Diffraction by planes in the sample cause X-rays of certain wavelengths to scatter out of the main beam, which do not then enter the detector. This causes an apparent drop in transmitted X-ray intensity at those energies, and thus a diffraction glitch.

Journal logoJOURNAL OF
ISSN: 1600-5775
Follow J. Synchrotron Rad.
Sign up for e-alerts
Follow J. Synchrotron Rad. on Twitter
Follow us on facebook
Sign up for RSS feeds