The Sr K-edge measured in transmission through a single crystal of SrF2 (top plot, left-hand scale). The amplitude has been normalized to unit edge jump. Diffraction glitches are clearly present on the absorption fine-structure. As the temperature of the specimen is changed by 1 K at room temperature, these glitches shift in energy due to thermal expansion in the crystal, producing the DiffXRD signal shown (bottom plot, right-hand scale). Here, Δχ is the change in fine-structure amplitude, where χ is the normalized oscillatory component of μ above the edge by convention.