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Figure 2
Scans along two perpendicular directions on the sample plane of a 16 µm titanium dot measured at the same time by XRF (Kα Ti fluorescence) and by Raman spectroscopy (521 cm−1 silicon signal).

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 5| August 2007| Pages 403-408
doi:10.1107/S0909049507028683
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