Figure 5
Integrated silicon powder diffraction patterns recorded on stations 9.1 (1800 s, image plate) and 9.5 (300 s, mar345 camera) using the arrangements shown in Fig. 1 and a pinhole size of 70 µm. The data from station 9.5 (squares, upper diffraction trace) have been divided by 7 and slightly offset. The intensity gain over station 9.1 (triangles, lower diffraction trace) is ∼100. |