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Figure 6
Diffraction pattern of HfW2O8 integrated using Fit2d from mar345 image-plate data obtained on station 9.5. The sample, held in a DAC at ambient pressure, was exposed for 120 s to obtain the image from which this pattern was integrated.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 5| August 2007| Pages 433-438
doi:10.1107/S0909049507027264
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