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Figure 7
Comparison of resolution (Δd/d against d) between silicon diffraction from the station 9.1 diffractometer (filled inverted triangles), station 9.1 image plate (filled triangles) and station 9.5 mar345 image plate (open triangles), and from HfW2O8, station 9.5 mar345 image plate (plus signs). The dashed curve shows the calculated combined bandwidth and divergence contribution to resolution. Solid lines are least-squares fits to HfW2O8 and silicon data.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 14| Part 5| August 2007| Pages 433-438
doi:10.1107/S0909049507027264
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