High-performance X-ray detectors for the new powder diffraction beamline I11 at Diamond

Tartoni, N.; Thompson, S.P.; Tang, C.C.; Willis, B.L.; Derbyshire, G.E.; Wright, A.G.; Jaye, S.C.; Homer, J.M.; Pizzey, J.D.; Bell, A.M.T.

doi:10.1107/S0909049507046250

Journal of Synchrotron Radiation Journal of
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Figure 10
(a) Silicon powder peak measured using a single analyser–detector pair with an X-ray beam of 15 keV. The solid line is the fitted curve using a pseudo-Voigt function and the difference between the experimental and fitted data is shown by the lower trace. (b) Silicon powder pattern obtained with an X-ray beam of 12.4 keV. The experimental data (points) were fitted using known structural details and experimental parameters.

JOURNAL OF
SYNCHROTRON
RADIATION

ISSN: 1600-5775

Volume 15| Part 1| December 2008| Pages 43-49

doi:10.1107/S0909049507046250

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