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Figure 1
The profiles of (a) Si (004) lattice misorientation, (c) peak intensity and (d) FWHM of the Si 004 θ rocking series, as a function of the [110] position across the two slip bands (S1 and S2) shown in the optical micrograph [the inset to (a)]. (b) Profile of `lattice plane height' variation, calculated from (a), showing the cross-sectional view of the Si (004) lattice plane profile in real space. The insets to (b) show enlarged views around the slip bands.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 1| December 2008| Pages 96-99
doi:10.1107/S0909049507045013
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