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Figure 2
Three X-ray topographs (g = 004) obtained by rocking-curve imaging, representing three local regions of the Si sample. The corresponding θ angles are indicated on the rocking curve [the inset to (c)]. Note the fragmented dislocation structure in (b), as schematically shown in the inset.

Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
ISSN: 1600-5775
Volume 15| Part 1| December 2008| Pages 96-99
doi:10.1107/S0909049507045013
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