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![[Figure 2]](pm5016fig2mag.jpg)
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Figure 2
(a) Diffraction pattern for the GroEL complex at an X-ray energy of 8 keV. (b) Scattered intensity per pixel after angular averaging at: (1) 5.4 keV and 1.8 × 106 photons s−1 nm−2 (APS); (2) 3.0 keV and 1.5 × 106 photons s−1 nm−2 (ALS); (3) 8.0 keV and 3 × 108 photons s−1 nm−2 (ERL). The inset shows the scattered counts per pixel for the incident flux (3) on the 256 × 256 grid, cut through the planes qx = 0 (solid line) and qy = 0 (dash line), indicated in (a). This figure will appear in colour in the online version of the paper. |
![[Figure 2]](pm5016fig2.jpg)
 | JOURNAL OF SYNCHROTRON RADIATION |
ISSN: 1600-5775
